Photoconductive Gain Behavior of Ni/β-Ga2O3 Schottky Barrier Diode-Based UV Detectors

A vertical Ni/β-Ga₂O₃ Schottky barrier diode was fabricated on an unintentionally doped bulk (-201)-oriented β-Ga₂O₃ single crystal and investigated with a focus on the underlying photoresponse mechanisms. The device exhibits well-defined rectifying behavior, characterized by a Schottky barrier height of 1.63 eV, an ideality factor of 1.39, and a high rectification ratio of ~9.7 × 10⁶ arb. un. at an applied bias of ±2 V. The structures demonstrate pronounced sensitivity to deep-ultraviolet radiation (λ ≤ 280 nm), with maximum responsivity observed at 255 nm, consistent with the wide bandgap of β-Ga₂O₃. Under 254 nm illumination at a power density of 620 μW/cm², the device operates in a self-powered mode, generating an open-circuit voltage of 50 mV and a short-circuit current of 47 pA, confirming efficient separation of photogenerated carriers by the built-in electric field of the Schottky junction. The responsivity and detectivity of the structures increase from 0.18 to 3.87 A/W and from 9.8 × 10⁸ to 4.3 × 10¹¹ Hz^0.5cmW^-1, respectively, as the reverse bias rises from 0 to -45 V. The detectors exhibit high-speed performance, with rise and decay times not exceeding 29 ms and 59 ms, respectively, at an applied voltage of 10 V. The studied structures demonstrate internal gain, with the external quantum efficiency reaching 1.8 × 10³%.