: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

We introduce a fast method to measure the conversion gain in complementary metal-oxide-semiconductor active pixel sensors, which accounts for nonlinearity and interpixel capacitance (IPC). The standard “mean-variance” method is biased because it assumes that pixel values depend linearly on the signal, and existing methods to correct for nonlinearity still introduce significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to calculate the gain almost instantaneously. Using test data from a flight detector of the ESA Euclid mission, the IPC correction recovers the results of slower methods with 0.1% accuracy. The nonlinearity correction ensures that the estimated gain is independent of signal, correcting a bias of more than 2.5%.

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Publication Details

Journal
Springer Link (Chiba Institute of Technology)
Published
2026-01-16
DOI
https://doi.org/10.1051/0004-6361/202556173/pdf
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
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article

: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

L. Conversi, D. Maino, S.-M Niemi, H.I Teplitz et al.
Springer Link (Chiba Institute of Technology)
CCD and CMOS Imaging Sensors
article

: methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

L. Conversi, D. Maino, S.-M Niemi, H.I Teplitz, E. Maiorano, E. Branchini, M. Frailis, S. Bardelli, S. Cavuoti, O. Marggraf, C.A.J. Duncan, S. Mei, T. Vassallo, L. Valenziano, F. Dubath, S.V.H. Haugan, F. Courbin, N. Fourmanoit, P. Hudelot, A. Cimatti, A. Veropalumbo, M. Seiffert, E. Medinaceli, B. Gillis, K. Jahnke, S. Camera, J.A. Schewtschenko, S. Ferriol, S. Pires, N. Martinet, W. Gillard, J. Weller, G. Congedo, G. Seidel, J. Dinis, C. Giocoli, S. Andreon, A. Renzi, E. Romelli, R. Toledo-Moreo, J.W. Nightingale, G. Meylan, Y. Wang, G. Castignani, M. Meneghetti, B. Sartoris, M. Farina, L. Moscardini, H.M. Courtois, R. Massey, K. Markovic, S. Farrens, M. Castellano, F. Torradeflot, I. Tutusaus, A. Hornstrup, F. Pasian, A. Secroun, R. Saglia, F. Raison, B. Kubik, I. Lloro, J. Rhodes, X. Dupac, A.N. Taylor, S. Dusini, D. Tavagnacco, J. Steinwagner, J. Le Graet, S. Escoffier, K. Pedersen, C. Carbone, A. Ealet, F. Marulli, G. Polenta, F. Faustini, V. Pettorino, D. Sapone, L.A. Popa, M. Schirmer, G. Sirri, E. Kajfasz, E. Rossetti, S. Galeotta, A. Da Silva, D. Maino, Y. Copin, C. Colodro-Conde, H. Kurki-Suonio, S. Paltani, J. Zoubian, O. Mansutti, R. Kohley, V. Capobianco, M. Jhabvala, P. Battaglia, D. Bonino, S. Kermiche, G. Riccio, M. Poncet, J. Carretero, F. Grupp, M. Kilbinger, M. Tourneur-Silvain, C. Padilla, E. Franceschi, A. Caillat, V. Lindholm, L. Conversi, A. Kiessling, S. Casas, I. Tereno, W. Holmes, M. Brescia, M. Baldi, M. Douspis, C. Sirignano, M. Roncarelli, M. Moresco, P. Tallada-Crespí, L. Stanco, G. Mainetti, F. Hormuth, J. Brinchmann
article en

Abstract

We introduce a fast method to measure the conversion gain in complementary metal-oxide-semiconductor active pixel sensors, which accounts for nonlinearity and interpixel capacitance (IPC). The standard “mean-variance” method is biased because it assumes that pixel values depend linearly on the signal, and existing methods to correct for nonlinearity still introduce significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to calculate the gain almost instantaneously. Using test data from a flight detector of the ESA Euclid mission, the IPC correction recovers the results of slower methods with 0.1% accuracy. The nonlinearity correction ensures that the estimated gain is independent of signal, correcting a bias of more than 2.5%.

Springer Link (Chiba Institute of Technology)
Openalex Percentile: Top 92%
CCD and CMOS Imaging Sensors
DOISourceOpenAlex
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