Nickel-oxide hole-transport layers prevent abrupt reverse-bias breakdown and permanent shorting of perovskite solar cells caused by pinhole defects
30-nm-thick sputtered nickel oxide hole-transport layers decrease the likelihood of abrupt reverse-bias breakdown, permanent shorting, and severe thermal damage in perovskite solar cells.
Authors
- Ryan A. DeCrescent (ORCID: https://orcid.org/0000-0003-3219-7736)
- Daniel Morales (ORCID: https://orcid.org/0000-0002-5645-9596)
- Matteo R. S. Poma
- T. Stewart
- Collin Sindt (ORCID: https://orcid.org/0000-0002-3845-3959)
- Kell Fremouw
- Michael D. McGehee
- Kaitian Mao
Institutions
- University of Colorado Boulder (US)
Publication Details
- Journal
- EES solar.
- Published
- 2026-01-01
- DOI
- https://doi.org/10.1039/d5el00206k
- Primary Topic
- Perovskite Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation
- University of Colorado Boulder
- Division of Materials Research