Synchronized modulation Kelvin probe force microscopy for surface photovoltage studies in optoelectronic systems

Authors

Zeinab Eftekhari (ORCID: https://orcid.org/0000-0002-2669-5600)
Rebecca Saive (ORCID: https://orcid.org/0000-0001-7420-9155)
Ursula Wurstbauer (ORCID: https://orcid.org/0000-0002-1764-5409)
Ariane Ufer

Institutions

University of Münster (DE)
University of Twente (NL)

Publication Details

Journal: MRS Communications
Published: 2026-01-08
DOI: https://doi.org/10.1557/s43579-025-00899-3
Primary Topic: Force Microscopy Techniques and Applications
Type: article
Field-Weighted Citation Impact: 0.00

Funders

Nederlandse Organisatie voor Wetenschappelijk Onderzoek

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article

Synchronized modulation Kelvin probe force microscopy for surface photovoltage studies in optoelectronic systems

Zeinab Eftekhari, Rebecca Saive, Ursula Wurstbauer, Ariane Ufer

Jan 8, 2026

MRS Communications

Force Microscopy Techniques and Applications

article

Synchronized modulation Kelvin probe force microscopy for surface photovoltage studies in optoelectronic systems

Zeinab Eftekhari, Rebecca Saive, Ursula Wurstbauer, Ariane Ufer

January 8, 2026article en

Abstract

No abstract available for this paper.

MRS CommunicationsVol. 16(1)

University of Münster (DE), University of Twente (NL)

Nederlandse Organisatie voor Wetenschappelijk Onderzoek

Affordable and clean energy

Openalex Percentile: Top 91%

Force Microscopy Techniques and Applications

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Synchronized modulation Kelvin probe force microscopy for surface photovoltage studies in optoelectronic systems — Zeinab Eftekhari, Rebecca Saive, et al. · MRS Communications (2026) | TGRS Research Map | TGRS