The x‐ and y‐Symmetrization of XPS Spectra, and the Creation of Models From x‐Symmetrized Spectra for the Visually Impaired
ABSTRACT We describe the x‐symmetrization of X ‐ray photoelectron spectroscopy (XPS) spectra as a possible alternative approach for viewing them. In x‐symmetrization, the counts at each binding energy in a spectrum are symmetrized or centered about the x ‐axis, altering the appearance of the spectrum. X‐symmetrized XPS spectra may accentuate background variations and other spectral features that may be less naturally emphasized in conventionally plotted spectra. They may also help identify when backgrounds have been appropriately placed across XPS narrow scans. An x‐symmetrized spectrum can be rotated about the x ‐axis to create a three‐dimensional depiction of it. 3D printed versions of such spectra may increase the accessibility of XPS spectra for the visually impaired. In y‐symmetrization, an XPS spectrum is symmetrized about the y ‐axis or at another binding energy. A comparison of a background‐subtracted peak to its y‐symmetrized rendition may help identify asymmetry in XPS peaks.
Authors
- Matthew R. Linford (ORCID: https://orcid.org/0000-0003-0460-041X)
- GJ Lewis
- Alvaro J. Lizarbe (ORCID: https://orcid.org/0000-0002-3404-6969)
- Jeff Terry (ORCID: https://orcid.org/0000-0003-3941-4991)
- Jacob Crossman (ORCID: https://orcid.org/0009-0000-4548-0405)
- Michael P. Jones
- Kristopher S. Wright
- Samira Jafari
Institutions
- Brigham Young University (US)
- Illinois Institute of Technology (US)
Publication Details
- Journal
- Surface and Interface Analysis
- Published
- 2026-01-08
- DOI
- https://doi.org/10.1002/sia.70043
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Brigham Young University