Correlating Structure Loss and Operational Conditions in Czochralski Silicon Ingot Growth Using Machine Learning

This work investigates the relationships between process parameters and the occurrence of structure loss in Czochralski silicon ingots using machine learning. Subsets of features are identified from a dataset of over 14,000 ingots and are used to train random forests to predict structure loss with high accuracy. Multiple rounds of feature importance analysis and refinement are conducted to isolate the process parameters that may have the most significant impact in the occurrence of structure loss. Partial dependence analysis is employed to examine how variations in particular parameters might affect the likelihood of structure loss happening. The results show that the most predictive features of structure loss are primarily recorded late in the process. These features are often influenced by manual interventions or reflect the outcome of structure loss itself. In contrast, early-stage parameters exhibit limited predictive power, suggesting that either early indicators of structure loss are not captured in the available data or that structure loss originates from events occurring later in the growth process. While not predictive in a preventive sense, the model effectively detects deviations from normal operation, thereby demonstrating the value of machine learning for uncovering complex patterns in manufacturing processes data.

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Publication Details

Journal
SiliconPV Conference Proceedings
Published
2026-01-06
DOI
https://doi.org/10.52825/siliconpv.v3i.2682
Primary Topic
Silicon and Solar Cell Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Correlating Structure Loss and Operational Conditions in Czochralski Silicon Ingot Growth Using Machine Learning

Marisa Di Sabatino, Alfredo Sanchez Garcia, Rania Hendawi, Hendrik Schön
SiliconPV Conference Proceedings
Silicon and Solar Cell Technologies
article

Correlating Structure Loss and Operational Conditions in Czochralski Silicon Ingot Growth Using Machine Learning

Marisa Di Sabatino, Alfredo Sanchez Garcia, Rania Hendawi, Hendrik Schön
article en

Abstract

This work investigates the relationships between process parameters and the occurrence of structure loss in Czochralski silicon ingots using machine learning. Subsets of features are identified from a dataset of over 14,000 ingots and are used to train random forests to predict structure loss with high accuracy. Multiple rounds of feature importance analysis and refinement are conducted to isolate the process parameters that may have the most significant impact in the occurrence of structure loss. Partial dependence analysis is employed to examine how variations in particular parameters might affect the likelihood of structure loss happening. The results show that the most predictive features of structure loss are primarily recorded late in the process. These features are often influenced by manual interventions or reflect the outcome of structure loss itself. In contrast, early-stage parameters exhibit limited predictive power, suggesting that either early indicators of structure loss are not captured in the available data or that structure loss originates from events occurring later in the growth process. While not predictive in a preventive sense, the model effectively detects deviations from normal operation, thereby demonstrating the value of machine learning for uncovering complex patterns in manufacturing processes data.

SiliconPV Conference ProceedingsVol. 3
Norwegian University of Science and Technology (NO), Forskning.no (Norway) (NO), NorSun (Norway) (NO)
Norges Forskningsråd
Openalex Percentile: Top 94%
Silicon and Solar Cell Technologies
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Correlating Structure Loss and Operational Conditions in Czochralski Silicon Ingot Growth Using Machine Learning — Marisa Di Sabatino, Alfredo Sanchez Garcia, et al. · SiliconPV Conference Proceedings (2026) | TGRS Research Map | TGRS