On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum
Authors
Arthur Gautheron (ORCID: https://orcid.org/0000-0002-9847-5367)
On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum
Arthur Gautheron, Mathieu Hébert, Vincent Duveiller, Lionel Simonot et al.
Journal
Optics Express
Topics
Photorefractive and Nonlinear Optics
article
On the validity of two-flux and four-flux models for light scattering in translucent layers: angular distribution of internally reflected light at the interfaces: erratum
Arthur Gautheron, Mathieu Hébert, Vincent Duveiller, Lionel Simonot, Bruno Montcel, Raphael Clerc
article en
Abstract
No abstract available for this paper.
Publication Tag
Optics ExpressVol. 34(2)
Institutions
Université Claude Bernard Lyon 1 (FR), Centre National de la Recherche Scientifique (FR), Institut Lumière Matière (FR), Université Jean Monnet (FR)