First demonstration of single event effects induced by secondary heavy ion beams at RAON

The first experimental demonstration of SEE (single event effect) induced by secondary heavy ion beams was performed at RAON. The secondary beams were produced via the projectile-like fragmentation, and delivered to a commercial LM4050 precision voltage reference under high vacuum conditions using KoBRA. The transient perturbations in output voltage, typical of SEEs, were observed in the device, without permanent damage. This work demonstrates the feasibility of employing secondary beams, including rare isotopes, for SEE testing of semiconductor devices and establishes a proof-of-concept for future radiation hardness evaluations.