Analysis of Near-miss Incidents and Their Causes during Clinical Training for Radiological Technologist Students
Near-miss experiences serve as valuable educational resources in student training. Redesigning safety education by focusing on common patterns shared with cases reported by licensed professionals, and systematizing these experiences into structured learning modules, may help enhance both the quality of education and safety awareness in radiological practice.
Authors
- Shuji Abe (ORCID: https://orcid.org/0000-0003-1325-482X)
- Wakana Yokotani
- Y.u.i. Takemoto
- S. HASHIMOTO
- Natsumi Kamiya
- Yuji Komatsu
- Marina Yamamura
- Mei Matsushita
Institutions
- Osaka Institute of Technology (JP)
Publication Details
- Journal
- Japanese Journal of Radiological Technology
- Published
- 2026-01-01
- DOI
- https://doi.org/10.6009/jjrt.26-1605
- Primary Topic
- Radiology practices and education
- Type
- article
- Field-Weighted Citation Impact
- 0.00