Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields
A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved, for the first time, weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP), revealing its quasi-three-dimensional field distribution.
Authors
- Chao Zuo (ORCID: https://orcid.org/0000-0002-1461-0032)
- Qian Chen (ORCID: https://orcid.org/0000-0001-6939-7438)
- Bowen Wang
Institutions
- Shanxi University (CN)
- Nanjing University of Science and Technology (CN)
- Jiangsu Industry Technology Research Institute (CN)
Publication Details
- Journal
- Light Science & Applications
- Published
- 2026-01-03
- DOI
- https://doi.org/10.1038/s41377-025-02110-7
- Primary Topic
- Near-Field Optical Microscopy
- Type
- article
- Field-Weighted Citation Impact
- 0.00