Improved phase retrieval based on bidimensional empirical mode decomposition for dual-wavelength off-axis digital holography

This paper presents an enhanced phase reconstruction method for simultaneous dual-wavelength off-axis digital holography that achieves both high computational efficiency and superior reconstruction quality. The proposed approach synergistically integrates bidimensional empirical mode decomposition (BEMD) with direct phase retrieval technology, enabling automatic decomposition of holograms into bidimensional intrinsic mode functions (BIMFs) for adaptive separation of fringe patterns and background components. Through selective enhancement of the real-image term and effective suppression of zero-order components in the BIMFs' frequency spectrum, our method isolates high-quality interference fringes while simultaneously mitigating overlapping artifacts and phase noise. Comprehensive validation through numerical simulations and experimental measurements demonstrates that the proposed technique maintains the computational advantages of direct phase retrieval while significantly improving reconstruction accuracy, providing a robust solution for high-precision dual-wavelength holographic applications.