Effect of polarization Coulomb field scattering on GaN devices
We present a comprehensive review and analysis of the polarization Coulomb field (PCF) scattering theory in GaN heterostructure field-effect transistors (GaN HFETs), which include AlGaN/GaN HFETs and InAlN/GaN HFETs. This paper develops a theoretical framework for understanding PCF scattering in GaN HFETs and explores its application in various areas, including device modeling, channel electron velocity modulation, circuit performance optimization, and the analysis of split-gate AlGaN/GaN HFETs. Additionally, we investigate the potential applications of PCF scattering theory in polar dielectric semiconductor devices and underscore its broader scientific significance.
Authors
- Heng Zhou (ORCID: https://orcid.org/0000-0001-8790-5870)
- Jianzhi Zhao (ORCID: https://orcid.org/0000-0002-0900-0141)
- Yuanjie Lv
- Zhaojun Lin
- Chen Fu
- Chongbiao Luan
- Peng Cui
- Mingyan Wang
- Ming Yang
Institutions
- Shandong University (CN)
- Shenzhen Institute of Information Technology (CN)
- China Academy of Engineering Physics (CN)
- Institute of Microelectronics (SG)
- Shandong Jiaotong University (CN)
- Shandong Iron and Steel Group (China) (CN)
- Aerospace Institute (Germany) (DE)
- Shenzhen Institutes of Advanced Technology (CN)
- Hebei Semiconductor Research Institute (CN)
Publication Details
- Journal
- Applied Physics Reviews
- Published
- 2026-01-02
- DOI
- https://doi.org/10.1063/5.0273085
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00