I-COR: Instruction-Level Fault Tolerance for Register File in 3-Stage Pipeline RISC-V Processors
The RISC-V architecture is increasingly deployed in safety-critical domains, such as automotive systems, yet the register file remains susceptible to Single Event Upsets (SEUs). Traditional fault-tolerance schemes like Triple Modular Redundancy (TMR) and Error Correction Codes (ECC) incur excessive area overhead (>200%) or significant performance penalties (15.3–20.5% timing degradation), and critically, cannot prevent error accumulation. To address this, we propose I-COR , an instruction-level correction scheme that targets register file data errors. When an instruction accesses a corrupted register, I-COR replaces it with a corrective instruction pair: the first instruction rectifies the erroneous value through the write-back path to prevent error accumulation, while the second re-executes the original operation. By reusing existing forwarding paths, this pair maintains pipeline efficiency, introducing just one-cycle correction latency. Implemented on the Ibex core and synthesized in 28 nm, 110 nm CMOS, and 180 nm SOI technologies, I-COR reduces area overhead by 50.92–62.83% compared to TMR while avoiding ECC’s timing degradation. Our automated two-stage fault-injection validation demonstrates I-COR’s effectiveness: it achieves complete elimination of critical faults (0% occurrence for both application output mismatches and system hangs) and reduces non-critical faults (internal architectural errors without system-level impact) down to 0.12–3.17%, outperforming existing schemes by 2.6–28.8×. By combining minimal area, zero timing penalty, single-cycle correction latency, and guaranteed prevention of error accumulation, I-COR provides an efficient architectural-level fault-tolerance solution specifically designed for register file protection in safety-critical three-stage pipeline RISC-V processors.
Authors
- Zewen Cao
- Ying Yang
- Qi Wang
Institutions
- Chinese Academy of Sciences (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- ACM Transactions on Embedded Computing Systems
- Published
- 2026-01-02
- DOI
- https://doi.org/10.1145/3787103
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00