A contrast-optimized hollow cone dark field imaging method for nanocrystalline in glass-ceramic materials
Hollow-cone dark-field (HCDF) imaging provides valuable structural information about polycrystalline and nanocrystalline materials. However, conventional HCDF imaging suffers from low contrast, particularly in samples containing amorphous phases in glass-ceramics. In this study, we propose an improved HCDF imaging method that replaces the continuous beam-tilting approach with a series of discrete dark-field (DF) images acquired by stepwise rotation of the electron beam. Each DF image corresponds to a specific position along the targeted diffraction ring. To enhance contrast, we introduce a selective averaging strategy that includes only the crystalline regions, segmented through a customized thresholding and morphological filtering process. This approach significantly improves the visualization of crystalline domains compared to conventional HCDF images. The method was validated using polycrystalline Au, LaSi<sub>2</sub>/TaSi<sub>2</sub>/Si composite nanomaterials, and in-situ annealed Li<sub>3</sub>PS<sub>4</sub> sulfide electrolytes. The results demonstrate enhanced contrast and clarity, particularly under conditions of low crystallinity, making the method especially effective for structural studies of glass-ceramics and other materials with low crystallinity.
Authors
- Yasuhiro Domi (ORCID: https://orcid.org/0000-0003-3983-2202)
- Shigeo Mori
- Hiroki Sakaguchi
- Jiong Ding
Institutions
- Osaka Prefecture University (JP)
- Tottori University (JP)
Publication Details
- Journal
- Micron
- Published
- 2025-12-31
- DOI
- https://doi.org/10.1016/j.micron.2025.103983
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00