Machine Learning-Based Material Thickness and Type Classification via Scattering Parameters

The precise determination of material type and thickness is of major significance in non-destructive testing, quality assurance, and materials science, as it influences the functionality, reliability, and performance of materials in engineering applications. This study proposes a methodology for the classification of material thickness and type through the analysis of scattering parameters within the 8–12 GHz frequency range. A database was created, encompassing real, imaginary, and dB values of reflection and transmission parameters for nine real-world materials with thicknesses ranging from 1 to 10 mm. This study addressed two main classification tasks, namely material thickness and material type. A variety of training–testing splits were employed in conjunction with 10-fold cross-validation to facilitate a comparison of classifier performance. In the material type classification, incorporating multiple thickness levels of each material enabled the model to distinguish materials with similar reflection characteristics more accurately, thereby enhancing discrimination performance. The results showed that Fine KNN consistently achieved 100% accuracy in thickness classification, while Quadratic SVM achieved 100% accuracy in material type classification, even when utilising only three thickness levels. Furthermore, the 90% training–10% testing split yielded the highest performance in thickness classification, whereas the optimal data split for material type classification differed across classifiers. Overall, this study demonstrates that the combination of scattering parameters and machine learning serves as a reliable and efficient approach for non-destructive material characterization.

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Publication Details

Journal
Applied Sciences
Published
2025-12-30
DOI
https://doi.org/10.3390/app16010391
Primary Topic
Microwave and Dielectric Measurement Techniques
Type
article
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article

Machine Learning-Based Material Thickness and Type Classification via Scattering Parameters

Mustafa Alptekin Engin, Mehmet Çakır
Applied Sciences
Microwave and Dielectric Measurement Techniques
article

Machine Learning-Based Material Thickness and Type Classification via Scattering Parameters

Mustafa Alptekin Engin, Mehmet Çakır
article en

Abstract

The precise determination of material type and thickness is of major significance in non-destructive testing, quality assurance, and materials science, as it influences the functionality, reliability, and performance of materials in engineering applications. This study proposes a methodology for the classification of material thickness and type through the analysis of scattering parameters within the 8–12 GHz frequency range. A database was created, encompassing real, imaginary, and dB values of reflection and transmission parameters for nine real-world materials with thicknesses ranging from 1 to 10 mm. This study addressed two main classification tasks, namely material thickness and material type. A variety of training–testing splits were employed in conjunction with 10-fold cross-validation to facilitate a comparison of classifier performance. In the material type classification, incorporating multiple thickness levels of each material enabled the model to distinguish materials with similar reflection characteristics more accurately, thereby enhancing discrimination performance. The results showed that Fine KNN consistently achieved 100% accuracy in thickness classification, while Quadratic SVM achieved 100% accuracy in material type classification, even when utilising only three thickness levels. Furthermore, the 90% training–10% testing split yielded the highest performance in thickness classification, whereas the optimal data split for material type classification differed across classifiers. Overall, this study demonstrates that the combination of scattering parameters and machine learning serves as a reliable and efficient approach for non-destructive material characterization.

Applied SciencesVol. 16(1)
Bayburt University (TR)
Reduced inequalities
Openalex Percentile: Top 41%
Microwave and Dielectric Measurement Techniques
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Machine Learning-Based Material Thickness and Type Classification via Scattering Parameters — Mustafa Alptekin Engin, Mehmet Çakır · Applied Sciences (2025) | TGRS Research Map | TGRS