Three-dimensional mapping of electrical behavior in perovskite films using tomographic conductive atomic force microscopy

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Journal
Newton
Published
2025-12-01
DOI
https://doi.org/10.1016/j.newton.2025.100367
Primary Topic
Electronic and Structural Properties of Oxides
Type
article
Field-Weighted Citation Impact
0.00

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article

Three-dimensional mapping of electrical behavior in perovskite films using tomographic conductive atomic force microscopy

Chuanxiao Xiao, M. Li, Yueying Zhang, Yating Shi et al.
Newton
Electronic and Structural Properties of Oxides
article

Three-dimensional mapping of electrical behavior in perovskite films using tomographic conductive atomic force microscopy

Chuanxiao Xiao, M. Li, Yueying Zhang, Yating Shi, Jichun Ye, Pengfei Wu, Yangyang Gou, Xiting Lang, Zhenhai Yang, Xirui Liu, Fei Zhang, Jiali Liu, Yongjie Jiang, Hao Tian, Yaxin Zhai
article en

Abstract

No abstract available for this paper.
Newton
Ningbo University (CN), Beijing Institute of Petrochemical Technology (CN), Tianjin University (CN), Hunan Normal University (CN), Chinese Academy of Sciences (CN), Soochow University (CN), Ningbo Institute of Industrial Technology (CN)
Education Department of Hunan Province, National Natural Science Foundation of China, Chinese Academy of Sciences, Natural Science Foundation of Tianjin City, Fundamental Research Funds for the Central Universities, International Cooperation Project of Ningbo City
Openalex Percentile: Top 47%
Electronic and Structural Properties of Oxides
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