Accurate Measurement of the Rocking Curve of a Planar Compound Refractive Lens for Synchrotron Radiation Focusing

The results of the first measurement of the rocking curve of a nanofocusing compound refractive lens made of silicon, used for focusing synchrotron radiation (SR) at the “KISI-Kurchatov” source, are presented. The obtained curve is accurately approximated by a Gaussian function, and its width is in agreement with the previously developed analytical theory, describing the SR propagation in multi-element focusing systems. The results demonstrate the feasibility of using the rocking curve as an alignment characteristic of the experimental setup when working with silicon lenses at second-generation SR sources.

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Publication Details

Journal
Crystallography Reports
Published
2025-12-01
DOI
https://doi.org/10.1134/s1063774525601431
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Accurate Measurement of the Rocking Curve of a Planar Compound Refractive Lens for Synchrotron Radiation Focusing

Yu. A. Volkovsky, M. S. Folomeshkin, A. E. Blagov, V. G. Kohn et al.
Crystallography Reports
Advanced X-ray Imaging Techniques
article

Accurate Measurement of the Rocking Curve of a Planar Compound Refractive Lens for Synchrotron Radiation Focusing

Yu. A. Volkovsky, M. S. Folomeshkin, A. E. Blagov, V. G. Kohn, A. A. Snigirev, A. Yu. Seregin, V. A. Yunkin, P. A. Prosekov
article en

Abstract

The results of the first measurement of the rocking curve of a nanofocusing compound refractive lens made of silicon, used for focusing synchrotron radiation (SR) at the “KISI-Kurchatov” source, are presented. The obtained curve is accurately approximated by a Gaussian function, and its width is in agreement with the previously developed analytical theory, describing the SR propagation in multi-element focusing systems. The results demonstrate the feasibility of using the rocking curve as an alignment characteristic of the experimental setup when working with silicon lenses at second-generation SR sources.

Crystallography ReportsVol. 70(6)
Immanuel Kant Baltic Federal University (RU), Kurchatov Institute (RU), Institute of Microelectronics Technology and High Purity Materials (RU)
Openalex Percentile: Top 27%
Advanced X-ray Imaging Techniques
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