Anisotropy of Mechanical Properties of CdTe-Based Crystals

Samples of CdTe-based crystals have been characterized. The elemental and phase compositions of the samples have been determined. The microhardness of the samples on two mutually perpendicular surfaces has been examined. It is shown that crystals with the main CdTe phase and different dopants exhibit no microhardness anisotropy. In crystals with the main CdZnTe phase, microhardness anisotropy has been found, which is related to different lengths of Cd–Te and Zn–Te bonds, which results in nonsymmetrical distortions of the crystal lattice. The observed difference in the microhardness of the CdTe crystals is explained by the difference in their structural parameters.

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Journal
Crystallography Reports
Published
2025-12-01
DOI
https://doi.org/10.1134/s106377452560142x
Primary Topic
Advanced Semiconductor Detectors and Materials
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article
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article

Anisotropy of Mechanical Properties of CdTe-Based Crystals

V. M. Kanevsky, I. S. Volchkov, I. O. Koshelev, N. A. Bashlykov et al.
Crystallography Reports
Advanced Semiconductor Detectors and Materials
article

Anisotropy of Mechanical Properties of CdTe-Based Crystals

V. M. Kanevsky, I. S. Volchkov, I. O. Koshelev, N. A. Bashlykov, P. L. Podkur, V. B. Kvartalov
article en

Abstract

Samples of CdTe-based crystals have been characterized. The elemental and phase compositions of the samples have been determined. The microhardness of the samples on two mutually perpendicular surfaces has been examined. It is shown that crystals with the main CdTe phase and different dopants exhibit no microhardness anisotropy. In crystals with the main CdZnTe phase, microhardness anisotropy has been found, which is related to different lengths of Cd–Te and Zn–Te bonds, which results in nonsymmetrical distortions of the crystal lattice. The observed difference in the microhardness of the CdTe crystals is explained by the difference in their structural parameters.

Crystallography ReportsVol. 70(6)
Kurchatov Institute (RU), A.V. Shubnikov Institute of Crystallography (RU), MIREA - Russian Technological University (RU)
Openalex Percentile: Top 42%
Advanced Semiconductor Detectors and Materials
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Anisotropy of Mechanical Properties of CdTe-Based Crystals — V. M. Kanevsky, I. S. Volchkov, et al. · Crystallography Reports (2025) | TGRS Research Map | TGRS