Pgf-based goodness-of-fit tests for binomial counts
Abstract Different types of omnibus goodness-of-fit tests for a binomial null hypothesis are developed, which are based on the counts’ probability generating function. For each statistic, closed-form asymptotics are derived and used to implement the tests in practice without the need for a bootstrap procedure. The finite-sample performance of the tests is analyzed by means of a comprehensive simulation study, and practical recommendations for the choice of the test statistic are given. The practical application of the tests is illustrated by a couple of real-world data examples.
Authors
- Christian Weiß (ORCID: https://orcid.org/0000-0001-8739-6631)
Institutions
- Helmut Schmidt University (DE)
Publication Details
- Journal
- Metrika
- Published
- 2025-12-24
- DOI
- https://doi.org/10.1007/s00184-025-01009-y
- Primary Topic
- Statistical Distribution Estimation and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00