EELS of phonons: polarity and temperature dependence

This paper provides an overview of phonon measurement using electron energy loss spectroscopy (EELS) in the electron microscope, with polar cubic boron nitride (c-BN) and nonpolar diamond crystals as representative examples. Differential scattering cross-sections for phonon creation and annihilation are reviewed, highlighting the influence of crystal polarity under kinematical and dynamical scattering conditions. The temperature dependence of EELS intensity is examined, with local absolute temperature evaluated by analysing the ratio of phonon annihilation to creation intensities. Practical aspects and challenges associated with phonon measurement in EELS are also discussed, together with future perspectives in this evolving field.

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Publication Details

Journal
Microscopy
Published
2025-12-17
DOI
https://doi.org/10.1093/jmicro/dfaf055
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

EELS of phonons: polarity and temperature dependence

Jun Kikkawa
Microscopy
Advanced Electron Microscopy Techniques and Applications
article

EELS of phonons: polarity and temperature dependence

Jun Kikkawa
article en

Abstract

This paper provides an overview of phonon measurement using electron energy loss spectroscopy (EELS) in the electron microscope, with polar cubic boron nitride (c-BN) and nonpolar diamond crystals as representative examples. Differential scattering cross-sections for phonon creation and annihilation are reviewed, highlighting the influence of crystal polarity under kinematical and dynamical scattering conditions. The temperature dependence of EELS intensity is examined, with local absolute temperature evaluated by analysing the ratio of phonon annihilation to creation intensities. Practical aspects and challenges associated with phonon measurement in EELS are also discussed, together with future perspectives in this evolving field.

Microscopy
National Institute for Materials Science (JP)
National Institute for Materials Science
Affordable and clean energy
Openalex Percentile: Top 17%
Advanced Electron Microscopy Techniques and Applications
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