Neutron Low Energy and Laser responses in Photodiodes for SEE Assesment

In this work we present a calibration method of pulsed laser energy to get the same (photo)ionization as the ionization due to a neutron induced nuclear reaction in silicon. Pulsed lasers are well known to produce single event effects (SEE) in electronics and detectors because there is a good correlation between the column photoionization and the trace ionization produced by a charged particle hitting a silicon device. In the case of neutron impact, the correlation is not so clear as the ionization is produced inside of the device by the ejectiles of a nuclear reaction. The final objective of this calibration is to reproduce neutron SEE in devices using pulsed lasers in an electronics laboratory.