Impedance-engineered Josephson parametric amplifier with single-step lithography
We present an experimental demonstration of an impedance-engineered Josephson parametric amplifier (IEJPA) fabricated in a single-step lithography process. Impedance-engineering is implemented using a lumped-element series LC circuit. We use a simpler lithography process where the entire device—impedance transformer and Josephson parametric amplifier (JPA)—is patterned in a single electron beam lithography step, followed by a double-angle Dolan-bridge technique for Al–AlOx–Al deposition. We observe amplification with 18 dB gain over a wide 400 MHz bandwidth centered around 5.3 GHz with added noise approaching the quantum limit, and a saturation power of −114 dBm. To accurately explain our experimental results, we extend existing theories for IEJPAs to incorporate the full sine nonlinearity of both the JPA and the transformer. Our work provides a route to simpler realization of broadband JPAs and a theoretical foundation for a regime of JPA operation that has been less explored in literature.
Authors
- Athreya Shankar (ORCID: https://orcid.org/0000-0003-3822-976X)
- Samarth Hawaldar (ORCID: https://orcid.org/0000-0002-1965-4309)
- Lipi Arvindbhai Patel
- Aditya Panikkar
- Baladitya Suri
Institutions
- Institute of Science and Technology Austria (AT)
- Indian Institute of Technology Madras (IN)
- Indian Institute of Science Bangalore (IN)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2025-12-22
- DOI
- https://doi.org/10.1063/5.0290636
- Primary Topic
- Advanced Electrical Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00