Impedance-engineered Josephson parametric amplifier with single-step lithography

We present an experimental demonstration of an impedance-engineered Josephson parametric amplifier (IEJPA) fabricated in a single-step lithography process. Impedance-engineering is implemented using a lumped-element series LC circuit. We use a simpler lithography process where the entire device—impedance transformer and Josephson parametric amplifier (JPA)—is patterned in a single electron beam lithography step, followed by a double-angle Dolan-bridge technique for Al–AlOx–Al deposition. We observe amplification with 18 dB gain over a wide 400 MHz bandwidth centered around 5.3 GHz with added noise approaching the quantum limit, and a saturation power of −114 dBm. To accurately explain our experimental results, we extend existing theories for IEJPAs to incorporate the full sine nonlinearity of both the JPA and the transformer. Our work provides a route to simpler realization of broadband JPAs and a theoretical foundation for a regime of JPA operation that has been less explored in literature.

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Publication Details

Journal
Applied Physics Letters
Published
2025-12-22
DOI
https://doi.org/10.1063/5.0290636
Primary Topic
Advanced Electrical Measurement Techniques
Type
article
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article

Impedance-engineered Josephson parametric amplifier with single-step lithography

Athreya Shankar, Samarth Hawaldar, Lipi Arvindbhai Patel, Aditya Panikkar et al.
Applied Physics Letters
Advanced Electrical Measurement Techniques
article

Impedance-engineered Josephson parametric amplifier with single-step lithography

Athreya Shankar, Samarth Hawaldar, Lipi Arvindbhai Patel, Aditya Panikkar, Baladitya Suri
article en

Abstract

We present an experimental demonstration of an impedance-engineered Josephson parametric amplifier (IEJPA) fabricated in a single-step lithography process. Impedance-engineering is implemented using a lumped-element series LC circuit. We use a simpler lithography process where the entire device—impedance transformer and Josephson parametric amplifier (JPA)—is patterned in a single electron beam lithography step, followed by a double-angle Dolan-bridge technique for Al–AlOx–Al deposition. We observe amplification with 18 dB gain over a wide 400 MHz bandwidth centered around 5.3 GHz with added noise approaching the quantum limit, and a saturation power of −114 dBm. To accurately explain our experimental results, we extend existing theories for IEJPAs to incorporate the full sine nonlinearity of both the JPA and the transformer. Our work provides a route to simpler realization of broadband JPAs and a theoretical foundation for a regime of JPA operation that has been less explored in literature.

Applied Physics LettersVol. 127(25)
Institute of Science and Technology Austria (AT), Indian Institute of Technology Madras (IN), Indian Institute of Science Bangalore (IN)
Openalex Percentile: Top 43%
Advanced Electrical Measurement Techniques
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