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Unraveling light induced ultrafast dynamics in three-dimensional Dirac materials is crucial for deepening our fundamental understanding and for advancing potential optoelectronic applications. While time-resolved pump-probe spectroscopy has predominantly revealed carrier dynamics governed by Dirac fermion cooling and population inversion, the full picture of relaxation pathways remains incomplete. In this Letter, we identify a relaxation channel in these materials. Using strong terahertz (THz) field excitation combined with a near-infrared (NIR) probe, we detect a long-lived carrier population persisting on the nanosecond timescale. This extended lifetime suggests that carriers become trapped in defect states, leading to sub-band-gap absorption in the NIR and pointing to the significant role of defect-assisted relaxation in the carrier dynamics of Dirac semimetals.
Authors
- Anonymous
Institutions
- TU Dortmund University (DE)
- Fudan University (CN)
- Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy (DE)
- Korea Institute of Science and Technology (KR)
Publication Details
- Journal
- Physical review. B./Physical review. B
- Published
- 2025-12-22
- DOI
- https://doi.org/10.1103/yj4s-7ks7
- Primary Topic
- Topological Materials and Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00