Solution-processed charge-trap/ferroelectric hybrid memory transistor for enhanced data storage and neuromorphic computing
Dual-gate multi-bit memory transistors that combine charge-trap and ferroelectric effects are demonstrated as a synaptic memory with high dynamic range.
Institutions
- University of Seoul (KR)
- Hanbat National University (KR)
Publication Details
- Journal
- Journal of Materials Chemistry C
- Published
- 2025-12-12
- DOI
- https://doi.org/10.1039/d5tc03771a
- Primary Topic
- Ferroelectric and Negative Capacitance Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00