Three-Dimensional Surface Reconstruction for Specular/Diffuse Composite Surfaces

[[abstract]]This paper presents an effective three-dimensional (3D) surface reconstruction technique aimed at profiling composite surfaces with both specular and diffuse reflectance. Three-dimensional measurements based on fringe projection techniques perform well on diffuse reflective surfaces; however, when the measurement targets contain both specular and diffuse components, the efficiency of fringe projection decreases. To address this issue, the proposed technique integrates digital holography into the fringe projection setup, enabling the simultaneous capture of both specular and diffuse reflected light in the same optical path for full-field surface profilometry. Experimental results demonstrate that this technique effectively detects and accurately reconstructs the 3D profiles of specular and diffuse reflectance, with fringe analysis providing the absolute phase of composite surfaces. The experiments validate the effectiveness of this technique in the 3D surface measurement of integrated circuit carrier boards with chips exhibiting composite surfaces.

Publication Details

Published
2024-12-01
Primary Topic
Optical measurement and interference techniques
Type
article
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article

Three-Dimensional Surface Reconstruction for Specular/Diffuse Composite Surfaces

Optical measurement and interference techniques
article

Three-Dimensional Surface Reconstruction for Specular/Diffuse Composite Surfaces

article en

Abstract

[[abstract]]This paper presents an effective three-dimensional (3D) surface reconstruction technique aimed at profiling composite surfaces with both specular and diffuse reflectance. Three-dimensional measurements based on fringe projection techniques perform well on diffuse reflective surfaces; however, when the measurement targets contain both specular and diffuse components, the efficiency of fringe projection decreases. To address this issue, the proposed technique integrates digital holography into the fringe projection setup, enabling the simultaneous capture of both specular and diffuse reflected light in the same optical path for full-field surface profilometry. Experimental results demonstrate that this technique effectively detects and accurately reconstructs the 3D profiles of specular and diffuse reflectance, with fringe analysis providing the absolute phase of composite surfaces. The experiments validate the effectiveness of this technique in the 3D surface measurement of integrated circuit carrier boards with chips exhibiting composite surfaces.

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