test–retest reliability and measurement error

Publication Details

Journal
Universidade Nova de Lisboa's Repository (Universidade Nova de Lisboa)
Published
2024-09-01
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

test–retest reliability and measurement error

Universidade Nova de Lisboa's Repository (Universidade Nova de Lisboa)
VLSI and Analog Circuit Testing
article

test–retest reliability and measurement error

article en

Abstract

No abstract available for this paper.
Universidade Nova de Lisboa's Repository (Universidade Nova de Lisboa)
Openalex Percentile: Top 47%
VLSI and Analog Circuit Testing
Open Access PDFOpenAlex
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