Восстановление оксида бора на поликристаллических подложках алюминия и самария

This paper investigates the reduction of boron oxide deposited by vacuum thermal evap- oration on aluminum and samarium surfaces using optical methods of Raman spectroscopy (RS) and spectral ellipsometry. Raman peaks corresponding to vibrations of β-rhombohedral boron (β-B).were de- tected in the spectra of these samples. Spectral ellipsometry was used to determine the optical constants and thickness of the nanoscale boron film in the spectral range from 270 nm to 1000 nm