Refractive Indexand Strain Modulation Tailor theAfterglow of Nanocomposite Films
Ballistic transmittance and transparency measurements; XRD patterns; ellipsometry spectra and fittings; transmission and reflection measurements; SEM image of SiO2 NP thick films; PL excitation spectra, PL decay and PLQY measurements; normalized TL glow curves and time-dependent afterglow decays; results of ellipsometry fits, results of UMA fits, and parameters used to fit luminescence kinetic scans using the local model
Publication Details
- Journal
- DIGITAL.CSIC (Spanish National Research Council (CSIC))
- Published
- 2025-10-01
- DOI
- https://doi.org/10.1021/acs.jpclett.5c02216.s001
- Primary Topic
- Luminescence Properties of Advanced Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00