Applying the NIST Statistical Test Suite to a TRNG of an Open-Source RISC-V Sub-System for PQC-Aware Industrial SoCs

Preprint of the paper presented to the 2025 IEEE Industrial Electronics and Applications Conference (IEACon) held in Kota Kinabalu, Sabah, Malaysia, from 8 to 9 September 2025.

Publication Details

Journal
Communities in ADDI (University of the Basque Country)
Published
2025-06-30
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Applying the NIST Statistical Test Suite to a TRNG of an Open-Source RISC-V Sub-System for PQC-Aware Industrial SoCs

Communities in ADDI (University of the Basque Country)
VLSI and Analog Circuit Testing
article

Applying the NIST Statistical Test Suite to a TRNG of an Open-Source RISC-V Sub-System for PQC-Aware Industrial SoCs

article en

Abstract

Preprint of the paper presented to the 2025 IEEE Industrial Electronics and Applications Conference (IEACon) held in Kota Kinabalu, Sabah, Malaysia, from 8 to 9 September 2025.

Communities in ADDI (University of the Basque Country)
Industry, innovation and infrastructure
Openalex Percentile: Top 37%
VLSI and Analog Circuit Testing
Open Access PDFOpenAlex
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Applying the NIST Statistical Test Suite to a TRNG of an Open-Source RISC-V Sub-System for PQC-Aware Industrial SoCs · Communities in ADDI (University of the Basque Country) (2025) | TGRS Research Map | TGRS