Integration of microchannel plate delay line detector within the Karabo control system at the SXP instrument of the European XFEL

The Soft X-Ray Port (SXP) instrument at European X-Ray Free Electron Laser (EuXFEL) facility is designed to provide a flexible environment for time and spin-resolved X-ray photoelectron spectroscopy (TR-XPES) experiments. Two key components of the TR-XPES experimental station are the time-of-flight (ToF) momentum microscope spectrometer and the microchannel plate delay line detector (MCP-DLD detector). This contribution describes the key steps and challenges of integration of the MCP-DLD detector at the SXP instrument and in to the Karabo control system.