Machine Learning and Deep Learning in Wafer Defect Detection: Current State and Future Directions

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Publication Details

Journal
SPIRE - Sciences Po Institutional REpository
Published
2025-11-29
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
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article

Machine Learning and Deep Learning in Wafer Defect Detection: Current State and Future Directions

SPIRE - Sciences Po Institutional REpository
Industrial Vision Systems and Defect Detection
article

Machine Learning and Deep Learning in Wafer Defect Detection: Current State and Future Directions

article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Association for Symbolic Logic (US)
Openalex Percentile: Top 37%
Industrial Vision Systems and Defect Detection
OpenAlex
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Machine Learning and Deep Learning in Wafer Defect Detection: Current State and Future Directions · SPIRE - Sciences Po Institutional REpository (2025) | TGRS Research Map | TGRS