On the Correctness of the Model Description of Plasma Composition in an SF6 + He + O2 Mixture

A comprehensive (experimental and model) study of the composition of the neutral and charged components of an SF6 + He + O2 plasma is conducted by varying the He/O2 ratio. Key plasma-chemical processes that form steady-state concentrations of fluorine and oxygen atoms under conditions of excess fluorine-containing particles are identified. It is shown that the adjusted (refined based on the results of recent work and supplemented with previously unaccounted for processes) kinetic scheme ensures satisfactory agreement between the calculated atomic concentrations and the values obtained from the results of optical-spectral diagnostics of the plasma.

Institutions

Publication Details

Journal
Russian Microelectronics
Published
2025-10-01
DOI
https://doi.org/10.1134/s1063739725600608
Primary Topic
Plasma Diagnostics and Applications
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

On the Correctness of the Model Description of Plasma Composition in an SF6 + He + O2 Mixture

Russian Microelectronics
Plasma Diagnostics and Applications
article

On the Correctness of the Model Description of Plasma Composition in an SF6 + He + O2 Mixture

article en

Abstract

A comprehensive (experimental and model) study of the composition of the neutral and charged components of an SF6 + He + O2 plasma is conducted by varying the He/O2 ratio. Key plasma-chemical processes that form steady-state concentrations of fluorine and oxygen atoms under conditions of excess fluorine-containing particles are identified. It is shown that the adjusted (refined based on the results of recent work and supplemented with previously unaccounted for processes) kinetic scheme ensures satisfactory agreement between the calculated atomic concentrations and the values obtained from the results of optical-spectral diagnostics of the plasma.

Russian MicroelectronicsVol. 54(5)
Moscow Institute of Physics and Technology (RU), Kurchatov Institute (RU), Research Institute of Molecular Electronics (RU)
Openalex Percentile: Top 47%
Plasma Diagnostics and Applications
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

On the Correctness of the Model Description of Plasma Composition in an SF6 + He + O2 Mixture · Russian Microelectronics (2025) | TGRS Research Map | TGRS