Certainly I-V Measurement of the Perovskite Device under Dim Light Intensity

The measured I-V hysteresis is complicated by the vast array of different perovskite solar cell (PSC) device architectures. In our study, we used a dynamic I-V, RTOS method, for I-V then the results showed better accuracy by eliminating in real time the acceptance effect. We also used this method with the testing procedure to compare emerging PV hysteresis behavior under dim light intensity of solar simulator. Therefore, we will compare difference between delay-time and RTOS method under dim light intensity, there are shown RTOS method more certainly I-V measurement of PSC under the dim light intensity.