Fine-Tuned <i>V</i> <sub>th</sub> for Logic Reconfigurability in Dual-Gate Zinc Oxynitride Transistors
Dual-gate transistors enable tunable electrical behavior by introducing a second gate electrode, offering enhanced control over channel formation and threshold voltage (Vth). Here, we report a dual-gate-controlled ZnON thin-film transistor (DGC-TFT) capable of finely modulating Vth (ΔV = 0.34 to 0.54 V) through independent top and bottom gate inputs. By characterizing the transfer and output curves under various bias combinations, we reveal systematic Vth shifts and dual-channel switching behavior arising from asymmetric gate dielectrics, organic parylene (top) and SiO2 (bottom). Finite-element TCAD simulations provide insights into the potential profiles, carrier distributions, and gate coupling mechanisms governing this behavior. Through this precise gate control, we demonstrate a dynamically tunable complementary inverter and implement five distinct logic functions (inverter, AND, OR, NAND, and NOR) using a single DGC-TFT device. These results highlight the promise of dual-gate architectures for compact, reconfigurable logic systems and adaptive circuit design.
Institutions
- Pohang University of Science and Technology (KR)
- Gachon University (KR)
- University of Ottawa (CA)
- Korea Atomic Energy Research Institute (KR)
- Fusion (United States) (US)
- Intelligent Fusion Technology (United States) (US)
- Hanyang University (KR)
- Sungkyunkwan University (KR)
Publication Details
- Journal
- ACS Applied Electronic Materials
- Published
- 2025-11-22
- DOI
- https://doi.org/10.1021/acsaelm.5c02047
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00