Assessment of the Thickness of the Anti-Reflective Film of a Solar Cell by Color
A method for estimating film thickness based on the color painting of the non-absorbing film-absorbing substrate system is proposed. The method can be useful for developing the technology of applying anti-reflective coatings to solar cells. The thickness of a dark blue anti-reflective SiO film applied to a silicon wafer was determined to illustrate the method.
Institutions
- Tashkent State Technical University named after Islam Karimov (UZ)
- National University of Uzbekistan (UZ)
Publication Details
- Journal
- Applied Solar Energy
- Published
- 2025-04-01
- DOI
- https://doi.org/10.3103/s0003701x25601401
- Primary Topic
- Silicon and Solar Cell Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00