Excellent X-band EMI shielding efficiency from engineered silver telluride (Ag2Te) nanoparticles

Herein, we present one-pot synthesis of aniline mediated and 2-mercaptoethanol (2-ME) capped silver telluride (Ag 2 Te) nanoparticles (NPs) via a solvothermal approach. Aniline and 2-ME play decisive role in reducing the precursor salts in-situ and for subsequent formation of stochiometric Ag 2 Te NPs of about 18–35 nm dimension, as confirmed by powder X-ray diffraction (XRD) measurement. Formation of silver nano-particles (Ag NPs) in absence of 2-ME was established in one of the experiments by observing surface plasmon resonance (SPR) at about 380 nm. Raman spectroscopy showed characteristic vibration of Te-O lower than 200 cm −1 hinting possible redox reaction on the surface. Differential scanning calorimetry (DSC) analysis showed phase change at 147 ºC. Similarly, presence of organics was understood by thermogravimetric analysis (TGA) which showed mass loss of about 5.0 %. Furthermore, morphology and surface topography of the so-synthesized Ag 2 Te NPs was studied by field emission scanning electron microscopy (FESEM), high-resolution transmission electron microscopy (HRTEM) and atomic force microscopy (AFM). The fabricated Ag/Ag 2 Te/PVA nanocomposite films showed excellent electrical conductivity to the tune of 887.4 S cm −1 . The present finding are believed to be the first ever report on electromagnetic shielding interference (EMI) using silver telluride. EMI was recorded using vector network analyser (VNA) and the Ag/Ag 2 Te/PVA nanocomposite film showed maximum absorption dominating (-50.49) shielding effectiveness of about − 65.5 dB with effective absorption (A eff ) of about 100 %. Fabricated flexible films of Ag/Ag 2 Te/PVA nano-composite showed high-performance X-Band EMI shielding effectiveness of about − 65.5 dB. • One-pot novel cost-effective, chemical synthesis of 2ME-capped Ag 2 Te nanoparticles by straightforward method. • Without any harsh reducing agents and high-pressure vessels at milder reaction conditions. • Formation of only the Ag NPs with its characteristic SPR band at 380 nm when the reaction is conducted in absence of 2-ME. • Synthesized Ag 2 Te NPs are stable up to 1000 ºC since TGA showed only 5 % degradation. • Fabrication of flexible Ag/Ag 2 Te/PVA nano-composite films showed excellent X-Band EMI SE of about -65.5 dB.

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Publication Details

Journal
Next Materials
Published
2025-11-24
DOI
https://doi.org/10.1016/j.nxmate.2025.101439
Citations
1
Primary Topic
Electromagnetic wave absorption materials
Type
article
Field-Weighted Citation Impact
0.43
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article

Excellent X-band EMI shielding efficiency from engineered silver telluride (Ag2Te) nanoparticles

1 citations
Next Materials
Electromagnetic wave absorption materials
0.43
article

Excellent X-band EMI shielding efficiency from engineered silver telluride (Ag2Te) nanoparticles

article en
1 citations

Abstract

Herein, we present one-pot synthesis of aniline mediated and 2-mercaptoethanol (2-ME) capped silver telluride (Ag 2 Te) nanoparticles (NPs) via a solvothermal approach. Aniline and 2-ME play decisive role in reducing the precursor salts in-situ and for subsequent formation of stochiometric Ag 2 Te NPs of about 18–35 nm dimension, as confirmed by powder X-ray diffraction (XRD) measurement. Formation of silver nano-particles (Ag NPs) in absence of 2-ME was established in one of the experiments by observing surface plasmon resonance (SPR) at about 380 nm. Raman spectroscopy showed characteristic vibration of Te-O lower than 200 cm −1 hinting possible redox reaction on the surface. Differential scanning calorimetry (DSC) analysis showed phase change at 147 ºC. Similarly, presence of organics was understood by thermogravimetric analysis (TGA) which showed mass loss of about 5.0 %. Furthermore, morphology and surface topography of the so-synthesized Ag 2 Te NPs was studied by field emission scanning electron microscopy (FESEM), high-resolution transmission electron microscopy (HRTEM) and atomic force microscopy (AFM). The fabricated Ag/Ag 2 Te/PVA nanocomposite films showed excellent electrical conductivity to the tune of 887.4 S cm −1 . The present finding are believed to be the first ever report on electromagnetic shielding interference (EMI) using silver telluride. EMI was recorded using vector network analyser (VNA) and the Ag/Ag 2 Te/PVA nanocomposite film showed maximum absorption dominating (-50.49) shielding effectiveness of about − 65.5 dB with effective absorption (A eff ) of about 100 %. Fabricated flexible films of Ag/Ag 2 Te/PVA nano-composite showed high-performance X-Band EMI shielding effectiveness of about − 65.5 dB. • One-pot novel cost-effective, chemical synthesis of 2ME-capped Ag 2 Te nanoparticles by straightforward method. • Without any harsh reducing agents and high-pressure vessels at milder reaction conditions. • Formation of only the Ag NPs with its characteristic SPR band at 380 nm when the reaction is conducted in absence of 2-ME. • Synthesized Ag 2 Te NPs are stable up to 1000 ºC since TGA showed only 5 % degradation. • Fabrication of flexible Ag/Ag 2 Te/PVA nano-composite films showed excellent X-Band EMI SE of about -65.5 dB.

Next MaterialsVol. 10
Defence Institute of Advanced Technology (IN)
Affordable and clean energy
Openalex Percentile: Top 32%
Electromagnetic wave absorption materials
0.43
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