Cost effective copper oxide thin layers by highly controlled spray pyrolysis method for optoelectronic devices

Copper Oxide (CuO) thin films were deposited via spray pyrolysis, and the effect of precursor concentration on their structural, morphological, optical, and electrical properties was systematically investigated. X-ray diffraction confirmed a monoclinic crystal structure with optimal crystallinity at 0.06 M, yielding a crystallite size of 25.27 nm. SEM and AFM analyses revealed improved surface uniformity, larger grains, and reduced defects at this concentration. The optimized films exhibited 63% average transmittance in the visible range and an optical bandgap between 1.53 and 2.10 eV. These results demonstrate that cost-effective CuO thin films can achieve properties comparable to those of metal oxides produced by more expensive techniques, positioning them as promising candidates for optoelectronic and photovoltaic applications.