A Fully Depleted 52 μm GS CIS Pixel with 6 ns Charge Transfer, rms Read Noise, 80 μV/e- CG and >80 % VIS-QE
Imec is developing a CMOS compatible image sensors. Full depletion allows enhancement of the charge collection speed in photodetectors. A 48x48 pixel test array with 52 μm pitch has been developed in this technology. An initial evaluation is presented in this paper. The device achieves 7 e-rms read noise at 80 μV/e- conversion gain. The mean charge transfer time is estimated to 6 ns. QE in the visible is expected to be >80 %.
Institutions
- Vrije Universiteit Brussel (BE)
Publication Details
- Journal
- IISS online library
- Published
- 2025-10-23
- DOI
- https://doi.org/10.60928/atn9-tpr8
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.00