Ultra-high vacuum scanning tunneling microscope-assisted atomic-scale manufacture of quantum devices
Publication Details
- Journal
- Chinese Science Bulletin (Chinese Version)
- Published
- 2025-10-01
- DOI
- https://doi.org/10.1360/csb-2025-5148
- Primary Topic
- Force Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00