Determination of defects properties in semiconductor through temperature dependent of Photoluminescence techniques : comparison between modulated and time-resolved regime

Publication Details

Journal
SPIRE - Sciences Po Institutional REpository
Published
2025-09-15
Primary Topic
Canadian Policy and Governance
Type
article
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article

Determination of defects properties in semiconductor through temperature dependent of Photoluminescence techniques : comparison between modulated and time-resolved regime

SPIRE - Sciences Po Institutional REpository
Canadian Policy and Governance
article

Determination of defects properties in semiconductor through temperature dependent of Photoluminescence techniques : comparison between modulated and time-resolved regime

article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Openalex Percentile: Top 38%
Canadian Policy and Governance
OpenAlex
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Determination of defects properties in semiconductor through temperature dependent of Photoluminescence techniques : comparison between modulated and time-resolved regime · SPIRE - Sciences Po Institutional REpository (2025) | TGRS Research Map | TGRS