Model validation of double phase fault in pentagon connected FPIM through simulation and experimentation
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Publication Details
- Journal
- International Journal of Power Electronics
- Published
- 2025-09-25
- DOI
- https://doi.org/10.1504/ijpelec.2026.10073691
- Primary Topic
- Image Processing and 3D Reconstruction
- Type
- article
- Field-Weighted Citation Impact
- 0.00