Analyzing Variability in Reconfigurable 2D-FET Circuits Using a Physics-Based SPICE Model

We present a physics-based static DC SPICE model for 2D-material-based reconfigurable FETs (RFETs) using our in-house core, which integrates Fermi–Dirac statistics with 2D density of states (DOS) and models transport via thermionic, field emission, and drift-diffusion formalisms. The model takes advantage of its SPICE compatibility by virtue of the Lambert-W function, which renders it compatible with Verilog-A, and is validated through experimental device and inverter characteristics. This is followed by model-based Monte Carlo simulations in Keysight’s ADS for circuit level variability analysis. Subsequently, the implementation of polymorphic NAND/NOR gates using the reconfigurable 2D-FETs is demonstrated for secure circuits.