Characterization Methods and Types of Electrical Noise in Resistors and Resistive Networks: A Systematic Review Protocol

This systematic review protocol outlines the methods and criteria for characterizing electrical noise in resistors and resistive networks. The review aims to map the types of electrical noise (thermal, flicker/1/f, shot, burst, excess), the characterization approaches used, and the resistor technologies investigated. Eligibility criteria include peer-reviewed articles, conference papers, and preprints in English addressing electrical noise characterization. Information sources include IEEE Xplore, Scopus, Web of Science, PubMed, and Scispace. Two independent reviewers will screen titles, abstracts, and full texts using Rayyan. Primary data items include noise type, characterization method, and resistor technology; secondary items include frequency range, temperature, instrumentation, sample size, and environment. The protocol describes qualitative synthesis and descriptive quantitative analysis, with no meta-analysis due to heterogeneity. Funding is external-free, and no conflicts of interest are declared. All search strategies, extracted datasets, and supplementary materials will be made publicly available.