Supplementary material for: Impact of Ni and O vacancies on the electronic properties of NiO: A DFT-based study for optoelectronic applications

Publication Details

Journal
AIP Publishing
Published
2025-09-19
DOI
https://doi.org/10.60893/figshare.apm.29998129
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

Supplementary material for: Impact of Ni and O vacancies on the electronic properties of NiO: A DFT-based study for optoelectronic applications

AIP Publishing
Geochemistry and Geologic Mapping
article

Supplementary material for: Impact of Ni and O vacancies on the electronic properties of NiO: A DFT-based study for optoelectronic applications

article en

Abstract

No abstract available for this paper.
AIP Publishing
Openalex Percentile: Top 34%
Geochemistry and Geologic Mapping
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Supplementary material for: Impact of Ni and O vacancies on the electronic properties of NiO: A DFT-based study for optoelectronic applications · AIP Publishing (2025) | TGRS Research Map | TGRS