Surface Kinetics and Viscosity in Amorphous As₂₀Se₈₀: A Comparative Study of Bulk and Thin Films Prepared by Thermal Evaporation and Spin-Coating

This dataset supports the publication in Physical Chemistry Chemical Physics entitled:"Surface kinetics and viscosity in amorphous As₂₀Se₈₀: a comparative study of bulk and thin films prepared by thermal evaporation and spin-coating." It includes all experimental data used for evaluating near-surface viscosity and kinetic parameters in both bulk samples and thin films of As₂₀Se₈₀, obtained using the following instruments and methodologies: Nanoindentation (NI) was performed using a Hysitron TI Premier nanoindenter (Bruker) equipped with an X-SOL 25 heating stage, providing temperature-dependent viscosity data. Pressure-assisted melt flow technique (PAMFT) was carried out in sealed capillaries under controlled argon pressure. Temperature was applied via a horizontal hot plate. Surface grating decay (SGD) measurements were performed using AFM Hitachi SPA400 in semi-contact mode for non-invasive amplitude decay tracking of sinusoidal patterns. Transmission-based grating decay was monitored in situ using a Tungsten halogen light source and a StellarNet BLUE-wave VIS spectrometer, with periodic structures created via soft imprinting using PDMS stamps (SYLGARD 184, Dow Corning). Chemical composition was analyzed using EDX on a Tescan LYRA 3 SEM equipped with an Oxford Instruments AZtec X-Max 20 detector. The Raman spectroscopy characterization was performed using Bruker MultiRam with a 1064 nm Nd:YAG laser. All raw data used for the derivation of viscosity values, activation energies, and surface kinetic constants are included in .xlsx and .txt formats. The dataset also contains time-resolved AFM profiles, Raman spectra, compositional data (EDS). This dataset is provided to support full reproducibility and transparency of the published results.