P‐153: Weibull‐Based Strength and Reliability Model of UTG for Flexible OLEDs

This study employs the 2PB test method to collect strength data of UTG processed with different technologies, which shows good conformity to the Weibull distribution. The research explains the reasons for the differences in Weibull distribution parameters, highlights the necessity of controlling certain key specifications, and provides recommendations for glass selection. Furthermore, based on Weibull distribution parameters from multiple mass production projects and simulated stress levels, combined with the CDF of the Weibull distribution, a relationship model between predicted and actual failure probabilities of UTG under various stress levels is established. This study provides new insights into large‐scale performance prediction and failure analysis of UTG in flexible display technology, making a significant contribution to improving the reliability and durability of OLED devices.