28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode

In this paper, we propose a set of tests for detecting line defects in display panels by integrating Touch with Display Driver (TDDI) technology and Gate‐driver‐on‐array (GOA) circuits. Currently, TDDI is widely adopted in displays with integrated touch functionality, serving both display driving and touch sensing purposes. The primary advantage of our approach is the utilization of the TDDI module's self‐diagnostic capabilities, which allow for effective defect detection even after the displays have been installed in high‐value products such as automobiles.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18169
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode

article en

Abstract

In this paper, we propose a set of tests for detecting line defects in display panels by integrating Touch with Display Driver (TDDI) technology and Gate‐driver‐on‐array (GOA) circuits. Currently, TDDI is widely adopted in displays with integrated touch functionality, serving both display driving and touch sensing purposes. The primary advantage of our approach is the utilization of the TDDI module's self‐diagnostic capabilities, which allow for effective defect detection even after the displays have been installed in high‐value products such as automobiles.

SID Symposium Digest of Technical PapersVol. 56(1)
National Yang Ming Chiao Tung University (TW), Novatek Microelectronics (Taiwan) (TW)
Openalex Percentile: Top 69%
Geochemistry and Geologic Mapping
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