P‐7: High‐Reliability LTPS‐TFT with Super‐Low Gate Resistivity

This study explores the adoption of low‐resistance gate wiring metals to enhance the scalability and functionality of LTPS‐TFT displays. By using aluminum (Al) as the gate metal material, we were able to reduce the resistivity of about 1/5 of the conventional level. The reliability of LTPS‐TFTs was significantly enhanced by incorporating a well‐designed light‐shield layer.

Institutions

Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18456
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

P‐7: High‐Reliability LTPS‐TFT with Super‐Low Gate Resistivity

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

P‐7: High‐Reliability LTPS‐TFT with Super‐Low Gate Resistivity

article en

Abstract

This study explores the adoption of low‐resistance gate wiring metals to enhance the scalability and functionality of LTPS‐TFT displays. By using aluminum (Al) as the gate metal material, we were able to reduce the resistivity of about 1/5 of the conventional level. The reliability of LTPS‐TFTs was significantly enhanced by incorporating a well‐designed light‐shield layer.

SID Symposium Digest of Technical PapersVol. 56(1)
Japan Display (Japan) (JP), Mi Corporation (United States) (US)
Openalex Percentile: Top 69%
Geochemistry and Geologic Mapping
DOIOpen Access PDFOpenAlex
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

P‐7: High‐Reliability LTPS‐TFT with Super‐Low Gate Resistivity · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS