P‐87: Cost‐Effective, High‐k AlOx Dielectric by Spray Pyrolysis for LTPS and Oxide Thin‐Film Transistors

We present a cost‐effective spray pyrolysis method to develop high‐k AlOx dielectric films for LTPS and IGO TFTs. The AlOx film shows a dielectric constant of 8.46 and a breakdown voltage of 9.25 MV/cm. Short‐channel p‐type LTPS and n‐type IGO TFTs with AlOx exhibit field‐effect mobilities of 90 and 23 cm²/V•s, respectively.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18549
Citations
1
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
2.48

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article

P‐87: Cost‐Effective, High‐k AlOx Dielectric by Spray Pyrolysis for LTPS and Oxide Thin‐Film Transistors

1 citations
SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
2.48
article

P‐87: Cost‐Effective, High‐k AlOx Dielectric by Spray Pyrolysis for LTPS and Oxide Thin‐Film Transistors

article en
1 citations

Abstract

We present a cost‐effective spray pyrolysis method to develop high‐k AlOx dielectric films for LTPS and IGO TFTs. The AlOx film shows a dielectric constant of 8.46 and a breakdown voltage of 9.25 MV/cm. Short‐channel p‐type LTPS and n‐type IGO TFTs with AlOx exhibit field‐effect mobilities of 90 and 23 cm²/V•s, respectively.

SID Symposium Digest of Technical PapersVol. 56(1)
University of Barishal (BD), Kyung Hee University (KR), Jagannath University (BD)
European Commission, HORIZON EUROPE Framework Programme
Openalex Percentile: Top 7%
Geochemistry and Geologic Mapping
2.48
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