99‐3: Direct perovskite X‐ray detector based on IGZO TFT backplane

The direct flat panel detector, fabricated from perovskite materials with a peroxide thin film transistor (TFT) backplane, exhibited exceptional detection performance. With an active area of 1024 × 1024 pixels, each a 100 μm pitch, the detector boasts a spatial resolution of 4.3 lp/mm The device employs an oxide TFT Gate Driver on Array (GOA) circuit for driving and is capable of capturing full‐resolution images at 15 frames per second

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18444
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

99‐3: Direct perovskite X‐ray detector based on IGZO TFT backplane

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

99‐3: Direct perovskite X‐ray detector based on IGZO TFT backplane

article en

Abstract

The direct flat panel detector, fabricated from perovskite materials with a peroxide thin film transistor (TFT) backplane, exhibited exceptional detection performance. With an active area of 1024 × 1024 pixels, each a 100 μm pitch, the detector boasts a spatial resolution of 4.3 lp/mm The device employs an oxide TFT Gate Driver on Array (GOA) circuit for driving and is capable of capturing full‐resolution images at 15 frames per second

SID Symposium Digest of Technical PapersVol. 56(1)
BOE Technology Group (China) (CN)
Openalex Percentile: Top 69%
Geochemistry and Geologic Mapping
DOISourceOpenAlex
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99‐3: Direct perovskite X‐ray detector based on IGZO TFT backplane · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS